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DNA Damage Recognition - Paperback

DNA Damage Recognition - Paperback

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by Wolfram Siede (Editor), Paul W. Doetsch (Editor)

Covering an array of topics, this authoritative work summarizes recent developments, while providing timely reviews on the molecular mechanisms employed by cells to distinguish between damaged and undamaged sites and stimulate the appropriate repair pathways. Richly illustrated, this guide discusses the theoretical aspects of DNA damage recognition, exploring those that are relevant for various regulatory responses, such as transcriptional regulation or checkpoint arrest. It also details key concepts in the recognition of bulky DNA base damage, reviews the excision repair of non-bulky base damage, covers short-patch repair and the recognition and repair of single- and double-strand breaks.

Author Biography

Wolfram Siede, Yoke Wah Kow, Paul W. Doetsch

Number of Pages: 896
Dimensions: 1.8 x 9.9 x 6.9 IN
Publication Date: October 18, 2019
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